DocumentCode
2865350
Title
Punch-through cell for dense bipolar ROMs
Author
Lohstroh, J. ; Slob, A.
Author_Institution
Philips Research Laboratory, Eindhoven, Netherlands
Volume
XXI
fYear
1978
fDate
15-17 Feb. 1978
Firstpage
20
Lastpage
21
Abstract
The punch-through effect, affording fast ROM cells, with projected areas of 250 μm2and smaller - down to 100 μm2- will be discussed. Using the CDI process, cells with selection and detection can be integrated on the same chip.
Keywords
Bipolar transistors; Doping; Epitaxial layers; Laboratories; Prototypes; Read only memory; Schottky diodes; Semiconductor device measurement; Substrates; Symmetric matrices;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1978.1155816
Filename
1155816
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