• DocumentCode
    2865621
  • Title

    Energy migration governs upconversion losses in Er3+-doped integrated amplifiers

  • Author

    Agazzi, L. ; Bradley, J.D.B. ; Ay, F. ; Kahn, A. ; Scheife, H. ; Huber, G. ; de Ridder, R.M. ; Wörhoff, K. ; Pollnau, M.

  • Author_Institution
    Integrated Opt. Microsyst. (IOMS) Group, Univ. of Twente, Enschede, Netherlands
  • fYear
    2009
  • fDate
    14-19 June 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    At high Er3+ doping, electric dipole-dipole interactions between neighboring ions such as energy migration and energy-transfer upconversion (ETU) take place, thereby reducing the population inversion and negatively affecting the gain performance of the amplifier. These effects are investigated by lifetime and gain measurements respectively, in Al2O3:Er3+ waveguides and analyzed the results in the frame of the microscopic model developed by Zubenko et al.
  • Keywords
    doping; erbium; integrated optics; optical losses; optical waveguides; population inversion; Al2O3:Er3+ waveguides; Er3+-doped integrated amplifiers; JkJk:Er; electric dipole-dipole interactions; energy migration; energy-transfer upconversion; gain; lifetime; population inversion; upconversion loss; Erbium; Integrated optics; Luminescence; Nanotechnology; Optical amplifiers; Optical losses; Optical materials; Optical waveguides; Performance gain; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-4079-5
  • Electronic_ISBN
    978-1-4244-4080-1
  • Type

    conf

  • DOI
    10.1109/CLEOE-EQEC.2009.5196506
  • Filename
    5196506
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2865621