DocumentCode
2865696
Title
On-chip monitors for system fault isolation
Author
D´Ambra, F. ; Menezes, M. ; Muller, Holger ; Stopper, Helga ; Ray Yuen
Author_Institution
Burroughs Corp., Detroit, MI, USA
Volume
XXI
fYear
1978
fDate
15-17 Feb. 1978
Firstpage
218
Lastpage
219
Abstract
On-chip circuits providing automatic, remote, and complete monitoring of all interconnects exterior to the die will be covered in this report. Proper monitor/logic sensitivity ratio assures detection of incipient faults and simplifies device testing, monitoring of on-chip functionality and final fault isolation.
Keywords
Circuit faults; Circuit testing; Computerized monitoring; Electrical fault detection; Fault detection; Integrated circuit interconnections; Logic devices; Logic testing; Remote monitoring; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1978.1155838
Filename
1155838
Link To Document