Title :
On-chip monitors for system fault isolation
Author :
D´Ambra, F. ; Menezes, M. ; Muller, Holger ; Stopper, Helga ; Ray Yuen
Author_Institution :
Burroughs Corp., Detroit, MI, USA
Abstract :
On-chip circuits providing automatic, remote, and complete monitoring of all interconnects exterior to the die will be covered in this report. Proper monitor/logic sensitivity ratio assures detection of incipient faults and simplifies device testing, monitoring of on-chip functionality and final fault isolation.
Keywords :
Circuit faults; Circuit testing; Computerized monitoring; Electrical fault detection; Fault detection; Integrated circuit interconnections; Logic devices; Logic testing; Remote monitoring; System-on-a-chip;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1978.1155838
