Title : 
Linearity of GaN HEMT RF power amplifiers - a circuit perspective
         
        
            Author : 
Sarbishaei, Hassan ; Wu, David Yu-Ting ; Boumaiza, Slim
         
        
            Author_Institution : 
University of Waterloo, Ontario, Canada, N2L 3G1
         
        
        
        
        
        
            Abstract : 
In this paper, the nonlinearity generation mechanisms causing AM/AM and AM/PM in GaN power amplifier are analyzed from a circuit perspective. The nonlinear device transconductance is found to be the primary source of slow compression in GaN PA´s AM/AM characteristic, while the nonlinear input capacitance is the primary source of AM/PM distortion. Using two 800 MHz GaN PAs, we show that matching networks optimized for linearity can minimize a PA´s nonlinear distortions and memory effects.
         
        
            Keywords : 
Capacitance; Frequency measurement; Gallium nitride; HEMTs; Harmonic analysis; Linearity; Logic gates; AM/AM; AM/PM; GaN power amplifiers; memory effect; static linearity;
         
        
        
        
            Conference_Titel : 
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
         
        
            Conference_Location : 
Montreal, QC, Canada
         
        
        
            Print_ISBN : 
978-1-4673-1085-7
         
        
            Electronic_ISBN : 
0149-645X
         
        
        
            DOI : 
10.1109/MWSYM.2012.6259553