• DocumentCode
    2865937
  • Title

    Semi-supervised clustering with metric learning using relative comparisons

  • Author

    Kumar, Nimit ; Kummamuru, Krishna ; Paranjpe, Deepa

  • Author_Institution
    Indian Inst. of Technol., IBM India Res. Lab, New Delhi, India
  • fYear
    2005
  • fDate
    27-30 Nov. 2005
  • Abstract
    Semi-supervised clustering algorithms partition a given data set using limited supervision from the user. In this paper, we propose a clustering algorithm that uses supervision in terms of relative comparisons, viz., x is closer to y than to z. The success of a clustering algorithm also depends on the kind of dissimilarity measure. The proposed clustering algorithm learns the underlying dissimilarity measure while finding compact clusters in the given data set. Through our experimental studies on high-dimensional textual data sets, we demonstrate that the proposed algorithm achieves higher accuracy than the algorithms using pair-wise constraints for supervision.
  • Keywords
    learning (artificial intelligence); pattern clustering; clustering algorithm; dissimilarity measure; metric learning; relative comparison; semisupervised clustering; Clustering algorithms; Data mining; Feedback; Nearest neighbor searches; Partitioning algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining, Fifth IEEE International Conference on
  • ISSN
    1550-4786
  • Print_ISBN
    0-7695-2278-5
  • Type

    conf

  • DOI
    10.1109/ICDM.2005.128
  • Filename
    1565759