DocumentCode
2865937
Title
Semi-supervised clustering with metric learning using relative comparisons
Author
Kumar, Nimit ; Kummamuru, Krishna ; Paranjpe, Deepa
Author_Institution
Indian Inst. of Technol., IBM India Res. Lab, New Delhi, India
fYear
2005
fDate
27-30 Nov. 2005
Abstract
Semi-supervised clustering algorithms partition a given data set using limited supervision from the user. In this paper, we propose a clustering algorithm that uses supervision in terms of relative comparisons, viz., x is closer to y than to z. The success of a clustering algorithm also depends on the kind of dissimilarity measure. The proposed clustering algorithm learns the underlying dissimilarity measure while finding compact clusters in the given data set. Through our experimental studies on high-dimensional textual data sets, we demonstrate that the proposed algorithm achieves higher accuracy than the algorithms using pair-wise constraints for supervision.
Keywords
learning (artificial intelligence); pattern clustering; clustering algorithm; dissimilarity measure; metric learning; relative comparison; semisupervised clustering; Clustering algorithms; Data mining; Feedback; Nearest neighbor searches; Partitioning algorithms;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining, Fifth IEEE International Conference on
ISSN
1550-4786
Print_ISBN
0-7695-2278-5
Type
conf
DOI
10.1109/ICDM.2005.128
Filename
1565759
Link To Document