DocumentCode
2865947
Title
A microwave noise and gain parameter test set
Author
Lane, R.
Author_Institution
California Eastern Laboratory, Inc., Burlingame, CA, USA
Volume
XXI
fYear
1978
fDate
15-17 Feb. 1978
Firstpage
172
Lastpage
173
Abstract
A calculator-controlled test set that automatically explores the source reflection coefficient plane using varactor tuning and calculates directly the best-fit noise and gain parameters of measured transistors will be described.
Keywords
Acoustic reflection; Diodes; Electrical resistance measurement; Equations; Microwave measurements; Noise figure; Noise measurement; Testing; Tuners; Varactors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1978.1155852
Filename
1155852
Link To Document