Title :
A microwave noise and gain parameter test set
Author_Institution :
California Eastern Laboratory, Inc., Burlingame, CA, USA
Abstract :
A calculator-controlled test set that automatically explores the source reflection coefficient plane using varactor tuning and calculates directly the best-fit noise and gain parameters of measured transistors will be described.
Keywords :
Acoustic reflection; Diodes; Electrical resistance measurement; Equations; Microwave measurements; Noise figure; Noise measurement; Testing; Tuners; Varactors;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1978.1155852
