Title : 
All-Optical Signal Processing with Ultralong Bulk Semiconductor Optical Amplifiers for Data Rates above 100Gb/s
         
        
            Author : 
Runge, P. ; Petermann, K.
         
        
            Author_Institution : 
Fachgebiet Hochfrequenztech., Tech. Univ. Berlin, Berlin, Germany
         
        
        
        
        
        
            Abstract : 
With increasing data rates in optical communication networks, high-speed solutions are needed. Using an ultralong bulk semiconductor optical amplifier (bulk UL-SOA), we present numerical results for wavelength conversion with extinction ratio (ER) improvement of 100Gb/s-RZ50% OOK signals. The purpose of UL-SOAs is to benefit from the semiconductor´s fast nonlinear intraband effects, while slow interband effects should be suppressed as far as possible in order to avoid bit pattern effects. Unlike in SOAs, the main part of UL-SOAs is deeply saturated by the amplified signals and the amplified spontaneous emission (ASE) after a certain length.
         
        
            Keywords : 
optical fibre networks; optical information processing; optical wavelength conversion; semiconductor optical amplifiers; superradiance; OOK signal; UL-SOA; all-optical signal processing; amplified spontaneous emission; bit pattern effect avoidance; bit rate 100 Gbit/s; nonlinear intraband effect; optical communication network; ultralong bulk semiconductor optical amplifiers; wavelength conversion; Band pass filters; Charge carrier lifetime; Erbium; Extinction ratio; Nonlinear optics; Optical filters; Optical saturation; Optical signal processing; Optical wavelength conversion; Semiconductor optical amplifiers;
         
        
        
        
            Conference_Titel : 
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
         
        
            Conference_Location : 
Munich
         
        
            Print_ISBN : 
978-1-4244-4079-5
         
        
            Electronic_ISBN : 
978-1-4244-4080-1
         
        
        
            DOI : 
10.1109/CLEOE-EQEC.2009.5196555