• DocumentCode
    2866611
  • Title

    Automatic test generation for LSI chips and printed circuit boards

  • Author

    Bottorff, P. ; France, Robert ; Godoy, H.

  • Author_Institution
    IBM Corp., Johnson City, NY, USA
  • Volume
    XXII
  • fYear
    1979
  • fDate
    14-16 Feb. 1979
  • Firstpage
    252
  • Lastpage
    253
  • Abstract
    This paper will describe automatic test pattern generation methods and results for level sensitive scan design chips and boards, suitable for LSI networks.
  • Keywords
    Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Design automation; Large scale integration; Logic testing; Printed circuits; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1979 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1979.1155891
  • Filename
    1155891
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2866611