DocumentCode :
2866614
Title :
Study on Travel Time Measurement with LCR Wave in Shear Stress Evaluation
Author :
Li, Lingxuan ; Ding, Jiexiong ; Liu, Fan ; Zhang, Jun
Author_Institution :
Sch. of Mechatronics Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu
fYear :
2006
fDate :
25-28 June 2006
Firstpage :
939
Lastpage :
944
Abstract :
In this paper, an experimental system of stress evaluation is introduced by using a special type of ultrasonic called critically refracted longitudinal (LCR) wave. Although the strain inside the object may affect the propagation velocity of the LCR waves in the direction of the stress field, actually it is difficult to measure the velocity change corresponding to the stress variation for its negligible alteration. The more effective way tends to measure the wave´s travel time in a fixed distance, which could be obtained through a particular method called zero crossing detection. In other words, collecting travel time data to further gain the linear relationship between time and stress is the essential problem in stress evaluation. The whole system is made up of several basic parts that work harmoniously under the control of MCU. These components include a drive unit, receiving unit and time measuring unit using high precision TDC (time to digital converter) as the time interval measuring chip, which are discussed in detail in this article
Keywords :
shear strength; stress measurement; time measurement; ultrasonic materials testing; ultrasonic measurement; ultrasonic propagation; ultrasonic refraction; MCU; critically refracted longitudinal wave; internal strain; linear time-stress relationship; shear stress evaluation; time interval measuring chip; time to digital converter; travel time measurement; ultrasonic testing; zero crossing detection; Chromium; Control systems; Gain; Particle measurements; Semiconductor device measurement; Strain measurement; Stress measurement; Time measurement; Ultrasonic variables measurement; Velocity measurement; Critically Refracted Longitudinal (LCR) Wave; TDC; shear stress evaluation; travel time; ultrasonic testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mechatronics and Automation, Proceedings of the 2006 IEEE International Conference on
Conference_Location :
Luoyang, Henan
Print_ISBN :
1-4244-0465-7
Electronic_ISBN :
1-4244-0466-5
Type :
conf
DOI :
10.1109/ICMA.2006.257751
Filename :
4026211
Link To Document :
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