DocumentCode :
2866695
Title :
Degradation free fast switching 1200 V 50 a silicon carbide BJT´s
Author :
Lindgren, Anders ; Domeij, Martin
Author_Institution :
TranSiC AB, Kista, Sweden
fYear :
2011
fDate :
6-11 March 2011
Firstpage :
1064
Lastpage :
1070
Abstract :
Silicon carbide (SiC) bipolar junction transistors (BJT´s) are normally-off fast switching devices with very low collector-emitter voltages (UCE), combining the best of properties from unipolar and bipolar technology. They switch fast with turnoffs from semi saturated state without current tails and have the same time extremely low saturated UCE values. SiC SBJT´s without bipolar degradation were fabricated and packaged in TO-247 packages. The BJT´s fabricated were characterized both statically and dynamically in a setup similar to a switching application, as well as tested for stability. A SPICE model was developed and simulations of the switching transitions were done and compared to measurements. Simulations of a boost converter were also done to show the efficiency improvements of a complete system made possible using this type of transistors.
Keywords :
SPICE; power bipolar transistors; silicon compounds; switching convertors; wide band gap semiconductors; SPICE model; SiC; TO-247 package; bipolar technology; boost converter; collector-emitter voltage; current 50 A; normally-off fast switching device; silicon carbide BJT; silicon carbide bipolar junction transistor; unipolar technology; voltage 1200 V; Capacitance; Current measurement; Silicon carbide; Switches; Temperature measurement; Transistors; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
Conference_Location :
Fort Worth, TX
ISSN :
1048-2334
Print_ISBN :
978-1-4244-8084-5
Type :
conf
DOI :
10.1109/APEC.2011.5744726
Filename :
5744726
Link To Document :
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