• DocumentCode
    2866720
  • Title

    Fab automation-where´s the payback?

  • Author

    Scott, Douglas

  • Author_Institution
    PRI Autom., Billerica, MA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    168
  • Lastpage
    174
  • Abstract
    Historically, a lot of attention has been given to improving the physics, the chemistry and the process technologies used in semiconductor manufacturing. This focus has produced dramatic results. Since its inception, the semiconductor industry has achieved productivity improvements unmatched by any industry ever. Shrinking feature sizes, larger wafers, yield improvements and other productivity gains have contributed to this success. However, most of the known technological capabilities will be approaching or have reached their limits within 10-15 years. Already, larger wafers and improved yields are making a smaller contribution to productivity improvements than they have in the past, creating a widening gap in the productivity curve. Also, during the past decade, mass consumerization and commoditization of the electronics industry has put increasing pressure on the profit margins of semiconductor manufacturers. These pressures are increasing, just when the annual productivity benefits from larger wafers and improved yields are starting to decline. This paper discusses performance enablers which help close the gap in the productivity curve, and results that have been achieved
  • Keywords
    computer integrated manufacturing; integrated circuit yield; process control; production control; stock control; annual productivity benefits; commoditization; fab automation; feature sizes; mass consumerization; productivity gains; productivity improvements; semiconductor manufacturing; yield improvements; Electronics industry; Logistics; Manufacturing automation; Manufacturing industries; Manufacturing processes; Metrology; Physics; Production facilities; Productivity; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 2000 IEEE/SEMI
  • Conference_Location
    Boston, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-5921-6
  • Type

    conf

  • DOI
    10.1109/ASMC.2000.902581
  • Filename
    902581