DocumentCode :
2867069
Title :
Fault impacts on solar power unit reliability
Author :
Bazzi, Ali M. ; Kim, Katherine A. ; Johnson, Brian B. ; Krein, Philip T. ; Dominguez-García, Alejandro
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2011
fDate :
6-11 March 2011
Firstpage :
1223
Lastpage :
1231
Abstract :
This paper introduces a generalized reliability model of a solar power unit (SPU) based on physical characteristics including material, operating conditions, and electrical ratings. An SPU includes a photovoltaic panel, power converter, control and sensing. Possible faults in each component of the unit are surveyed and their failure rates based on physics-of-failure models are formulated. PV panel faults include possible installation faults, environmental effects, and material degradation. Power electronics faults are developed in depth for different components of a dc-dc boost converter. A system-level simulation model is developed and verified experimentally, and then used to define the survivor function of the SPU. Results show that it is important to include panel faults for accurate reliability values. The developed model is flexible and can be tailored for various SPU operating conditions, panel designs, and electrical ratings. The proposed reliability model can be extended to parallel and series interconnected topologies of multiple SPUs.
Keywords :
DC-DC power convertors; photovoltaic power systems; power generation faults; power generation reliability; solar power stations; DC-DC boost converter; PV panel fault; SPU; fault impact; photovoltaic panel; physic-of- failure model; power converter; power electronic; solar power unit reliability model; system-level simulation model; Capacitors; Circuit faults; Converters; Degradation; Integrated circuit modeling; Reliability; Sensors; photovoltaic reliability; reliability modeling procedure; solar power unit;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
Conference_Location :
Fort Worth, TX
ISSN :
1048-2334
Print_ISBN :
978-1-4244-8084-5
Type :
conf
DOI :
10.1109/APEC.2011.5744749
Filename :
5744749
Link To Document :
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