DocumentCode :
2867238
Title :
A CMOS Burst-Mode TIA with Step AGC and Selective Internally Created Reset for 1.25Gb/s EPON
Author :
Le, Quan ; Lee, Sang-Gug ; Kang, Ho-Yong ; Chai, Sang-Hoon
Author_Institution :
Inf. & Communcations Univ., Daejeon
fYear :
2007
fDate :
11-15 Feb. 2007
Firstpage :
50
Lastpage :
51
Abstract :
A selective internal reset mechanism that allows the burst-mode TIA to recover a burst-mode signal as a stand-alone device in EPON is discussed. Using step AGC, the TIA achieves a DR of 27dB and a sensitivity of -31dBm with a PIN photodiode. Moreover, with internal reset, the loud/soft ratio is also 27dB within 100ns guard and preamble times.
Keywords :
CMOS integrated circuits; amplifiers; automatic gain control; optical communication equipment; p-i-n diodes; photodiodes; CMOS technology; EPON; PIN photodiode; automatic gain control; burst mode; passive optical networks; selective internal reset; transimpedance amplifiers; Bit error rate; EPON; Optical network units; Optical receivers; Partial discharges; Passive optical networks; Signal generators; Solid state circuits; Switches; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
1-4244-0853-9
Electronic_ISBN :
0193-6530
Type :
conf
DOI :
10.1109/ISSCC.2007.373582
Filename :
4242259
Link To Document :
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