• DocumentCode
    2867255
  • Title

    High current and thermal transient design of a SiC SSPC for aircraft application

  • Author

    Guo, Yuan-Bo ; Bhat, Krishna P. ; Aravamudhan, Arunkumar ; Hopkins, Douglas C. ; Hazelmyer, Donald R.

  • Author_Institution
    Univ. at Buffalo (State Univ. of New York at Buffalo), Buffalo, NY, USA
  • fYear
    2011
  • fDate
    6-11 March 2011
  • Firstpage
    1290
  • Lastpage
    1297
  • Abstract
    Solid-State Power Controllers (SSPCs) are critical components in the development of electric aircraft and must be small in size, fast in response, and have high reliability. The development of Silicon Carbide (SiC) semiconductor switches provides a series of improvements for the SSPCs in both electrical and thermal performances. In the proposed SSPC design, SiC MOSFETs die are mounted on cast-aluminum traces, under which are an aluminum nitride (AlN) layer and an aluminum composite baseplate. The concept of i2t and its application in solid state protection is discussed. Transient thermal characterizations of SiC MOSFETs are provided on this nearly-all-aluminum package by Finite Element Analysis (FEA). Electrical experiments are combined to demonstrate critical transient thermal performance of a 120A-nominal/1200A-fault, 320Vdc SSPC designed for 350°C SiC transient junction temperature.
  • Keywords
    MOSFET; aircraft; electric vehicles; finite element analysis; power control; semiconductor switches; MOSFET; SSPC; SiC; aircraft application; aluminum nitride layer; cast-aluminum traces; current 120 A; electric aircraft; finite element analysis; high current transient design; silicon carbide semiconductor switches; solid-state power controllers; temperature 350 C; thermal transient design; voltage 320 V; Aircraft; Heating; Junctions; MOSFETs; Silicon carbide; Transient analysis; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
  • Conference_Location
    Fort Worth, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-8084-5
  • Type

    conf

  • DOI
    10.1109/APEC.2011.5744759
  • Filename
    5744759