DocumentCode
2867469
Title
Determining the capacity components of multi chamber systems
Author
Mcclintock, Michael ; Martin, Donald ; Woods, Roger
Author_Institution
Microelectron. Div., IBM Corp., Essex Junction, VT, USA
fYear
2000
fDate
2000
Firstpage
466
Lastpage
468
Abstract
In order to effectively manage productivity improvements for equipment in a semiconductor manufacturing line, it is necessary to understand and measure all the components of capacity loss for each tool type. This paper describes a data analysis system that was developed to specifically address the unique issues in understanding the capacity components of multi chamber systems. The analysis system expresses all components of capacity loss for all chambers in each tool in terms of a full tool equivalent (FTE)
Keywords
semiconductor device manufacture; capacity component; data analysis; equipment productivity; full tool equivalent; multi-chamber system; semiconductor manufacturing facility; Availability; Etching; Loss measurement; Microelectronics; Production; Productivity; Pulp manufacturing; Rivers; Semiconductor device manufacture; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 2000 IEEE/SEMI
Conference_Location
Boston, MA
ISSN
1078-8743
Print_ISBN
0-7803-5921-6
Type
conf
DOI
10.1109/ASMC.2000.902630
Filename
902630
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