• DocumentCode
    2867469
  • Title

    Determining the capacity components of multi chamber systems

  • Author

    Mcclintock, Michael ; Martin, Donald ; Woods, Roger

  • Author_Institution
    Microelectron. Div., IBM Corp., Essex Junction, VT, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    466
  • Lastpage
    468
  • Abstract
    In order to effectively manage productivity improvements for equipment in a semiconductor manufacturing line, it is necessary to understand and measure all the components of capacity loss for each tool type. This paper describes a data analysis system that was developed to specifically address the unique issues in understanding the capacity components of multi chamber systems. The analysis system expresses all components of capacity loss for all chambers in each tool in terms of a full tool equivalent (FTE)
  • Keywords
    semiconductor device manufacture; capacity component; data analysis; equipment productivity; full tool equivalent; multi-chamber system; semiconductor manufacturing facility; Availability; Etching; Loss measurement; Microelectronics; Production; Productivity; Pulp manufacturing; Rivers; Semiconductor device manufacture; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 2000 IEEE/SEMI
  • Conference_Location
    Boston, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-5921-6
  • Type

    conf

  • DOI
    10.1109/ASMC.2000.902630
  • Filename
    902630