• DocumentCode
    2867542
  • Title

    A switching converter based electronic load

  • Author

    Upadhyay, Saurabh ; Mishra, Santanu ; Joshi, Avinash

  • Author_Institution
    GE Global Res., Bangalore, India
  • fYear
    2011
  • fDate
    6-11 March 2011
  • Firstpage
    1394
  • Lastpage
    1397
  • Abstract
    Electronic loads (E-Load) are commonly used to test power supplies. In order to test computer power supplies, the E-Load must possess an ideal controlled current source property which draws a desired load current even in the case of a very low terminal voltage of the Source-under-test (SUT). It also needs to have superior dynamic performance to simulate high slew rate load transients. This paper proposes the design of a switching converter based E-Load architecture with very large operational bandwidth. The overall architecture of the E-Load consists of a low-bandwidth converter, which functions under steady-state, and a high-bandwidth auxiliary circuit that is only active during transient load scenario. The converter circuit is realized using a novel switched-boost topology and the auxiliary circuit is realized using a MOSFET operating at the edge of saturation and linear region. A prototype is built to test the proposed architecture. The operational input voltage (SUT voltage) ranges of the prototype are between 0.5 V to 6 V. The load current range is between 0.75 A to 7 A. The results also validate the excellent dynamic characteristics of the proposed architecture.
  • Keywords
    power MOSFET; switching convertors; E-Load; MOSFET; computer power supplies; current 0.75 A to 7 A; electronic loads; high-bandwidth auxiliary circuit; low-bandwidth converter; source-under-test; switched-boost topology; switching converter; voltage 0.5 V to 6 V; Converters; MOSFET circuits; Power supplies; Prototypes; Steady-state; Switches; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
  • Conference_Location
    Fort Worth, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-8084-5
  • Type

    conf

  • DOI
    10.1109/APEC.2011.5744774
  • Filename
    5744774