Title :
ESPI contouring with Fourier analysis in artwork diagnostics
Author :
Spagnolo, G. Schirripa ; Paoletti, D. ; Bagini, V. ; Gori, F. ; Santarsiero, M.
Author_Institution :
Dipartimento di Energetica, Univ. Dell´´Aquila, Roio Poggio, Italy
Abstract :
A contouring technique, based on electronic speckle pattern interferometry (ESPI), is developed for surface profile measurements in conservation studies. A portable interferometer with optical fibre has been realized. The correlation contouring fringes are analyzed by a Fourier transform technique. Some preliminary tests on laboratory models are reported
Keywords :
Fourier transform optics; art; electronic speckle pattern interferometry; surface topography measurement; Fourier transform technique; artwork diagnostics; conservation studies; contouring technique; correlation contouring fringes; electronic speckle pattern interferometry; laboratory models; optical fibre; portable interferometer; surface profile measurements;
Conference_Titel :
Holographic Systems, Components and Applications, 1993., Fourth International Conference on
Conference_Location :
Neuchatel
Print_ISBN :
0-85296-578-8
