Title :
An ECL 100K compatible 1024 × 4b RAM with 15ns access time
Author :
Buerker, U. ; Glock, H.
Author_Institution :
Siemens AG, Munich, Germany
Abstract :
An ECL 100K compatible 1024×4b RAM with typical 15ns access time and 900mW dissipation will be discussed, citing results obtained from prototypes.
Keywords :
Circuit testing; Clamps; Decoding; Delay effects; Differential amplifiers; Diodes; Driver circuits; Isolation technology; Metallization; Springs;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1979 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1979.1155977
