• DocumentCode
    2868379
  • Title

    Fully automated measurement set-up for ultra-fast recovery diode testing

  • Author

    Stahl, Juergen ; Kuebrich, Daniel ; Duerbaum, Thomas ; Oeder, Christian

  • Author_Institution
    Dept. of Electromagn. Fields, Friedrich-Alexander-Univ. of Erlangen Nuremberg, Erlangen, Germany
  • fYear
    2011
  • fDate
    6-11 March 2011
  • Firstpage
    1680
  • Lastpage
    1686
  • Abstract
    Often data sheets provide only poor information about the recovery behavior of ultra-fast diodes. On the other hand, existing diode models do not predict the real characteristic for all diodes. Nevertheless, due to its importance, this behavior needs to be known and therefore measured. For this purpose, a fully automated measurement set-up for determining the reverse recovery characteristic of ultra-fast diodes in an accurate manner was designed and is described here. All the data obtained is immediately transferred into MATLAB and therefore available for further calculation, model building and model validation. Since the whole set-up is automated, a complete field of variations in the reverse voltage, the forward current, the temperature, and the di/dt can be easily applied to the tested diode. Hence, a lot of information can be obtained effortlessly. This uncomplicated methodology makes it readily available for circuit designers, allowing them to predict the contribution of the reverse recovery of rectifiers to the total losses more accurately. In addition, a real comparison of different diodes at many operation points is made possible.
  • Keywords
    mathematics computing; semiconductor device measurement; semiconductor device models; semiconductor device testing; MATLAB; circuit designers; fully automated measurement set-up; ultra-fast diodes; ultra-fast recovery diode testing; Current measurement; MATLAB; MOSFET circuits; Oscilloscopes; Resistors; Temperature measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
  • Conference_Location
    Fort Worth, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-8084-5
  • Type

    conf

  • DOI
    10.1109/APEC.2011.5744821
  • Filename
    5744821