Title :
Early evaluation of bus interconnects dependability for system-on-chip designs
Author :
Lajolo, Marcello ; Reorda, Matteo Sonza ; Violante, Massimo
Author_Institution :
NEC Res. Inst., Princeton, NJ, USA
Abstract :
This paper presents a methodology for designing system-on-chip interconnection architectures providing a high level of protection from crosstalk and single-event upsets. An event driven simulator enriched with fault injection capabilities is exploited to evaluate the dependability level of the system being designed. The simulation environment supports several bus coding protocols and thus designers can easily evaluate different design alternatives. To enhance the dependability level of the interconnection architecture, we propose a distributed bus guardian scheme, where dedicated hardware modules monitor the integrity of the information transmitted over the bus and provide error correction mechanisms. Preliminary experimental results on a small benchmark system are reported showing the effectiveness of the proposed methodology
Keywords :
VLSI; application specific integrated circuits; circuit simulation; crosstalk; discrete event simulation; error correction; integrated circuit design; integrated circuit interconnections; radiation effects; benchmark system; bus coding protocols; bus interconnects dependability; crosstalk; dedicated hardware modules; dependability level; distributed bus guardian scheme; error correction mechanisms; event driven simulator; fault injection capabilities; interconnection architectures; single-event upsets; system-on-chip designs; Copper; Crosstalk; Discrete event simulation; Hardware; Integrated circuit interconnections; Neutrons; Protection; Single event transient; System-on-a-chip; Wires;
Conference_Titel :
VLSI Design, 2001. Fourteenth International Conference on
Conference_Location :
Bangalore
Print_ISBN :
0-7695-0831-6
DOI :
10.1109/ICVD.2001.902687