• DocumentCode
    2868402
  • Title

    Early evaluation of bus interconnects dependability for system-on-chip designs

  • Author

    Lajolo, Marcello ; Reorda, Matteo Sonza ; Violante, Massimo

  • Author_Institution
    NEC Res. Inst., Princeton, NJ, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    371
  • Lastpage
    376
  • Abstract
    This paper presents a methodology for designing system-on-chip interconnection architectures providing a high level of protection from crosstalk and single-event upsets. An event driven simulator enriched with fault injection capabilities is exploited to evaluate the dependability level of the system being designed. The simulation environment supports several bus coding protocols and thus designers can easily evaluate different design alternatives. To enhance the dependability level of the interconnection architecture, we propose a distributed bus guardian scheme, where dedicated hardware modules monitor the integrity of the information transmitted over the bus and provide error correction mechanisms. Preliminary experimental results on a small benchmark system are reported showing the effectiveness of the proposed methodology
  • Keywords
    VLSI; application specific integrated circuits; circuit simulation; crosstalk; discrete event simulation; error correction; integrated circuit design; integrated circuit interconnections; radiation effects; benchmark system; bus coding protocols; bus interconnects dependability; crosstalk; dedicated hardware modules; dependability level; distributed bus guardian scheme; error correction mechanisms; event driven simulator; fault injection capabilities; interconnection architectures; single-event upsets; system-on-chip designs; Copper; Crosstalk; Discrete event simulation; Hardware; Integrated circuit interconnections; Neutrons; Protection; Single event transient; System-on-a-chip; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2001. Fourteenth International Conference on
  • Conference_Location
    Bangalore
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-0831-6
  • Type

    conf

  • DOI
    10.1109/ICVD.2001.902687
  • Filename
    902687