A parallel built-in self-diagnostic method for embedded memory buffers

Author

Huang, D.C. ; Jone, W.B. ; Das, S.R.

Author_Institution

Dept. of Comput. Sci., Nat. Chung-Cheng Univ., Taiwan

fYear

2001

fDate

2001

Firstpage

397

Lastpage

402

Abstract

In this paper, we propose a new built-in self-diagnosis (BISD) method to simultaneously diagnose and repair spatially distributed memory modules with different sizes. Based on the serial interfacing technique, the serial fault masking effect is observed and a bi-directional serial interfacing technique is proposed to deal with such an issue. By tolerating redundant read/write operations, we develop a new march algorithm called DiagRSMarch to achieve the goals of low hardware overhead, tolerable diagnostic time, and high diagnostic coverage

Keywords

VLSI; buffer storage; built-in self test; fault diagnosis; modules; redundancy; BISD; DiagRSMarch; bi-directional serial interfacing technique; diagnostic coverage; diagnostic time; embedded memory buffers; hardware overhead; march algorithm; parallel built-in self-diagnostic method; redundant read/write operations; serial fault masking effect; spatially distributed memory modules; Bidirectional control; Degradation; Fabrication; Fault diagnosis; Hardware; Neural networks; Random access memory; Reduced instruction set computing; Testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 2001. Fourteenth International Conference on

Conference_Location

Bangalore

ISSN

1063-9667

Print_ISBN

0-7695-0831-6

Type

conf

DOI

10.1109/ICVD.2001.902691

Filename

902691