• DocumentCode
    2868679
  • Title

    Contactless impedance measurement of large-area high-quality graphene

  • Author

    Skulason, H.S. ; Nguyen, H.V. ; Guermoune, A. ; Siaj, M. ; Caloz, C. ; Szkopek, T.

  • Author_Institution
    Dept. of Electrical and Computer Engineering, McGill University, Montréal, Québec, H3A 2A7, Canada
  • fYear
    2012
  • fDate
    17-22 June 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    We present experimental work on the contactless measurement of graphene sheet impedance at frequencies up to 110 GHz in different waveguide geometries. Low-loss coplanar waveguides in series and shunt configuration have been demonstrated. A new coaxial waveguide coupled Corbino disk geometry with facile fabrication is introduced. Critical to the success of these measurements is a low contact impedance at high-frequencies, wherein the dc contact resistance is shunted by a contact capacitance that ultimately enables contactless measurement. The quasi-optic nature of waveguide measurements minimizes the effect of inevitable cracks in the graphene sheet, in contrast with typical transport measurements. We have applied our technique to the characterization of the sheet impedance and contact impedance of large-area, high-quality graphene grown by chemical vapour deposition.
  • Keywords
    Contacts; Coplanar waveguides; Electrical resistance measurement; Impedance; Optical waveguides; Resistance; Transmission line measurements; Graphene; contact impedance; sheet impedance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
  • Conference_Location
    Montreal, QC, Canada
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-1085-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2012.6259711
  • Filename
    6259711