DocumentCode
2868875
Title
A Practical Extension of Pairwise Testing
Author
Oksoon Jeong
Author_Institution
LG Electron., Seoul, South Korea
fYear
2012
fDate
27-30 Nov. 2012
Firstpage
116
Lastpage
122
Abstract
For the interaction testing, there have been a variety of tools to efficiently generate test cases using Pair wise or In-Parameter-Order (or IPO) technique. Especially, PICT and AETG among these tools provide not only a combination technique of input parameters to generate test cases but also practical features to create feasible test cases in industry. Nonetheless, practicing these tools in industry has still some difficulties, designing test cases using these tools is applied into only very few areas of features of a system to be tested. Therefore, this paper proposes additional features which could overcome these limitations and extend features to be designed, it could reflect test engineers´ considerations or behaviors when designing feasible test cases related to generating sequential test scenario, considering exceptional test cases, writing readable test cases, and iteratively updating test cases. Consequently, the given system this paper suggests could give test engineers free time to focus on test design engineering to advance test design skills or techniques, because it makes it possible that a time consuming and labor-intensive work like not only repetitively executing test cases but also even iteratively re-designing test cases could be assigned to outsourcing resources or testers with low-cost or low-capability.
Keywords
automatic test pattern generation; AETG; PICT; in-parameter-order technique; interaction testing; pairwise testing; test case generation; Algorithm design and analysis; Automation; Feature extraction; Industries; Software; Testing; Universal Serial Bus; iterative test design; pairwise testing; practical test design; practical test design system; sequential test case generation; test case generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering Workshops (ISSREW), 2012 IEEE 23rd International Symposium on
Conference_Location
Dallas, TX
Print_ISBN
978-1-4673-5048-8
Type
conf
DOI
10.1109/ISSREW.2012.11
Filename
6405427
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