Title :
Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs
Author :
Fukazawa, Mitsuya ; Matsuno, Tetsuro ; Uemura, Toshifumi ; Akiyama, Rei ; Kagemoto, Tetsuya ; Makino, Hiroshi ; Takata, Hidehiro ; Nagata, Makoto
Author_Institution :
Kobe Univ.
Abstract :
Fine-grained built-in probing circuits are distributed at 120 locations on the SoC to allow continuous-time monitoring of power-supply variations. On-die high-precision sampling circuits with 800muV/100ps resolution allow probing of 26 chip-wide locations of the CPU core including SRAM modules. Analog waveforms and peak-voltage measurements show confirmation of dynamic operation-mode transitions.
Keywords :
SRAM chips; signal processing equipment; system-on-chip; 800 muV; SRAM modules; continuous-time monitoring; power-supply variations; sampling circuits; system-on-chip; Central Processing Unit; Clocks; Frequency; Integrated circuit measurements; Integrated circuit noise; Logic; Monitoring; Probes; Random access memory; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0853-9
Electronic_ISBN :
0193-6530
DOI :
10.1109/ISSCC.2007.373407
