DocumentCode
2869141
Title
Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs
Author
Fukazawa, Mitsuya ; Matsuno, Tetsuro ; Uemura, Toshifumi ; Akiyama, Rei ; Kagemoto, Tetsuya ; Makino, Hiroshi ; Takata, Hidehiro ; Nagata, Makoto
Author_Institution
Kobe Univ.
fYear
2007
fDate
11-15 Feb. 2007
Firstpage
288
Lastpage
603
Abstract
Fine-grained built-in probing circuits are distributed at 120 locations on the SoC to allow continuous-time monitoring of power-supply variations. On-die high-precision sampling circuits with 800muV/100ps resolution allow probing of 26 chip-wide locations of the CPU core including SRAM modules. Analog waveforms and peak-voltage measurements show confirmation of dynamic operation-mode transitions.
Keywords
SRAM chips; signal processing equipment; system-on-chip; 800 muV; SRAM modules; continuous-time monitoring; power-supply variations; sampling circuits; system-on-chip; Central Processing Unit; Clocks; Frequency; Integrated circuit measurements; Integrated circuit noise; Logic; Monitoring; Probes; Random access memory; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
1-4244-0853-9
Electronic_ISBN
0193-6530
Type
conf
DOI
10.1109/ISSCC.2007.373407
Filename
4242378
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