Title :
On-Die Supply-Voltage Noise Sensor with Real-Time Sampling Mode for Low-Power Processor Applications
Author :
Sato, Tomio ; Inoue, Akira ; Shiota, Tetsuyoshi ; Inoue, Takeru ; Kawabe, Yukihito ; Hashimoto, Tetsutaro ; Imamura, Toshifumi ; Murasaka, Yoshitaka ; Nagata, Makoto ; Iwata, Atsushi
Author_Institution :
Fujitsu Labs., Kawasaki
Abstract :
A real-time on-die noise sensor continuously detects up to 100 noise events per second without disturbing processor operations, using a 400kb/s serial interface. The noise sensor uses histogram counters and variable detection windows. The sensor measures periodic and single-events in real time. The noise sensor is implemented in a 90nm CMOS testchip.
Keywords :
CMOS integrated circuits; electric noise measurement; electric sensing devices; integrated circuit noise; low-power electronics; microprocessor chips; peripheral interfaces; 400 kbit/s; CMOS testchip; histogram counters; low-power processor applications; on-die supply-voltage noise sensor; real-time on-die noise sensor; real-time sampling; serial interface; variable detection windows; Bandwidth; Circuit noise; Energy consumption; Frequency; Low-frequency noise; Noise figure; Sampling methods; Testing; Variable structure systems; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0853-9
Electronic_ISBN :
0193-6530
DOI :
10.1109/ISSCC.2007.373408
