DocumentCode :
2869269
Title :
Intrinsically switchable thin film ferroelectric resonators
Author :
Sis, Seyit Ahmet ; Lee, Victor ; Phillips, Jamie D. ; Mortazawi, Amir
Author_Institution :
Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, 48109, USA
fYear :
2012
fDate :
17-22 June 2012
Firstpage :
1
Lastpage :
3
Abstract :
This paper presents DC voltage dependent thin film bulk acoustic wave resonators (FBARs) based on ferroelectric barium strontium titanate (BST). The electrostrictive effect in BST film that enables the resonances to switch on and off with dc bias is discussed. Composite BST FBARs that consist of BST, platinum (Pt), silicon (Si), and oxide (SiO2) layers are discussed by comparing with the conventional FBAR structure. For composite FBARs, the BST layer is primarily used for transduction while the Si and SiO2 layers are used to increase the overall quality factor (Q). Measurement results of a composite FBAR show a Q that exceeds 600 at its parallel resonance frequency of 2.169 GHz and an electromechanical coupling coefficient of 0.68%.
Keywords :
Acoustic measurements; Film bulk acoustic resonators; Microwave filters; Silicon; Switches; Titanium compounds; Barium strontium titanate; composite FBAR; ferroelectric devices; intrinsically switchable devices; thin film bulk acoustic wave resonators (FBAR);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC, Canada
ISSN :
0149-645X
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2012.6259744
Filename :
6259744
Link To Document :
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