Title :
Hierarchical Test Program Development for Scan Testable Circuits
Author :
Leenstra, Jens ; Spaanenburg, Lambert
Keywords :
Assembly; Automatic testing; Circuit faults; Circuit testing; Design for testability; Integrated circuit testing; Microelectronics; Sequential analysis; Shift registers; System testing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519697
