DocumentCode :
2869397
Title :
Practical visual inspection techniques - optics, micro-electronics and advanced software technology
Author :
Hata, Seiji
Author_Institution :
Kagawa University
Volume :
4
fYear :
2000
fDate :
3-7 Sept. 2000
Firstpage :
114
Lastpage :
117
Keywords :
Cameras; Charge coupled devices; Charge-coupled image sensors; Dynamic range; Image processing; Inspection; Optical devices; Optical imaging; Optical sensors; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Conference_Location :
Barcelona, Spain
ISSN :
1051-4651
Print_ISBN :
0-7695-0750-6
Type :
conf
DOI :
10.1109/ICPR.2000.902877
Filename :
902877
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2869397
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