Title :
The effect of sea level cosmic rays on electronic devices
Author :
Ziegler, Jens ; Lanford, W.
Author_Institution :
IBM Research Center, Yorktown Heights, NY, USA
Abstract :
The evaluation of the effects of cosmic rays on computer memories and its application to typical memory devices will be discussed. Conclusions indicate that cosmic ray nucleons and muons could have a significant effect on the next generation of computer memory circuitry. Error rates increase rapidly with altitude, offering the potential of accelerated testing to make electronic equipment less sensitive to the cosmic rays.
Keywords :
Charge measurement; Cosmic rays; Current measurement; Electronic circuits; Ionization; Laboratories; Physics; Sea level; Sea measurements; Silicon;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1980.1156060