DocumentCode :
2869504
Title :
The effect of sea level cosmic rays on electronic devices
Author :
Ziegler, Jens ; Lanford, W.
Author_Institution :
IBM Research Center, Yorktown Heights, NY, USA
Volume :
XXIII
fYear :
1980
fDate :
13-15 Feb. 1980
Firstpage :
70
Lastpage :
71
Abstract :
The evaluation of the effects of cosmic rays on computer memories and its application to typical memory devices will be discussed. Conclusions indicate that cosmic ray nucleons and muons could have a significant effect on the next generation of computer memory circuitry. Error rates increase rapidly with altitude, offering the potential of accelerated testing to make electronic equipment less sensitive to the cosmic rays.
Keywords :
Charge measurement; Cosmic rays; Current measurement; Electronic circuits; Ionization; Laboratories; Physics; Sea level; Sea measurements; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
Conference_Location :
San Francisco, CA, USA
Type :
conf
DOI :
10.1109/ISSCC.1980.1156060
Filename :
1156060
Link To Document :
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