Title :
Selectable Length Partial Scan: A Method to Reduce Vector Length
Author :
Morley, Sean P. ; Marlett, Ralph A.
Keywords :
Application specific integrated circuits; Automatic generation control; Automatic testing; Circuit testing; Clocks; Equations; Pins; Protocols; Sequential analysis; Sequential circuits;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519698
