Title :
Session 7 design aids technology limits
Author_Institution :
IBM Laboratories, Boeblingen, Germany
Abstract :
Presents a synopsis of the sessions held at the conference proceedings.
Keywords :
Design aids and technology limits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1980.1156061
