Title :
On Multiple Path Propagating Tests for Path Delay Faults
Author :
Pramanick, Ankan K. ; Reddy, Sudhakar M.
Keywords :
Circuit faults; Circuit testing; Clocks; Data systems; Electrical fault detection; Fault detection; Logic circuits; Propagation delay; Robustness; Timing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519699
