DocumentCode
2869926
Title
A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for Sequential Circuits
Author
Cheng, Kwang-Ting ; Devadas, Srinivas ; Keutzer, Kurt
fYear
1991
fDate
26-30 Oct 1991
Firstpage
403
Keywords
Circuit faults; Circuit testing; Delay; Flip-flops; Integrated circuit synthesis; Integrated circuit testing; Robustness; Sequential analysis; Sequential circuits; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519700
Filename
519700
Link To Document