Title :
A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for Sequential Circuits
Author :
Cheng, Kwang-Ting ; Devadas, Srinivas ; Keutzer, Kurt
Keywords :
Circuit faults; Circuit testing; Delay; Flip-flops; Integrated circuit synthesis; Integrated circuit testing; Robustness; Sequential analysis; Sequential circuits; Very large scale integration;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519700
