DocumentCode :
2869967
Title :
On-chip sensing and actuation methods for integrated self-healing mm-wave CMOS power amplifier
Author :
Sengupta, Kaushik ; Dasgupta, Kaushik ; Bowers, Steven M. ; Hajimiri, Ali
Author_Institution :
California Institute of Technology, Pasadena, 91125, USA
fYear :
2012
fDate :
17-22 June 2012
Firstpage :
1
Lastpage :
3
Abstract :
This paper presents various low power, compact, low insertion-loss sensors with digitized ADC output and digitally controlled actuation methods for on-chip characterization and healing of a mm-Wave power amplifier. We demonstrate low insertion loss (0.4dB) RF sensors which measure true input and output power in presence of load variations and very low-headroom (10–30mV) DC sensors with built-in regulators and thermal sensors as methods for measuring PA efficiency. All sensor outputs are digitized by a SAR-based ADC for communication with a central digital core. The paper also presents digitally controlled combiner tuning and PA bias actuation. The circuits are implemented in 45 nm SOI CMOS and enable full on-chip digitally controlled characterization and actuation of the PA with a power overhead of less than 6%.
Keywords :
Current measurement; Power amplifiers; Power measurement; Temperature measurement; Thermal sensors; Transmission line measurements; CMOS; PA; actuation; self-healing; sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC, Canada
ISSN :
0149-645X
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2012.6259781
Filename :
6259781
Link To Document :
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