DocumentCode :
2869998
Title :
Design pattern detection in Eiffel systems
Author :
Wang, Wei ; Tzerpos, Vassilios
Author_Institution :
York Univ., Toronto, Ont., Canada
fYear :
2005
fDate :
7-11 Nov. 2005
Abstract :
The use of design patterns in a software system can provide strong indications about the rationale behind the system´s design. As a result, automating the detection of design pattern instances could be of significant help to the process of reverse engineering large software systems. In this paper, we introduce DPVK (Design Pattern Verification toolKit), the first reverse engineering tool to detect pattern instances in Eiffel systems. DPVK is able to detect several different design patterns by examining both the static structure and the dynamic behaviour of a system written in Eiffel. We present three case studies that were performed to assess DPVK´s effectiveness.
Keywords :
object-oriented programming; reverse engineering; Design Pattern Verification toolkit; Eiffel system; reverse engineering tool; software design pattern detection; software system design; Databases; Design engineering; Detectors; Documentation; Face detection; Process design; Reverse engineering; Software design; Software engineering; Software systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reverse Engineering, 12th Working Conference on
ISSN :
1095-1350
Print_ISBN :
0-7695-2474-5
Type :
conf
DOI :
10.1109/WCRE.2005.14
Filename :
1566156
Link To Document :
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