• DocumentCode
    2869998
  • Title

    Design pattern detection in Eiffel systems

  • Author

    Wang, Wei ; Tzerpos, Vassilios

  • Author_Institution
    York Univ., Toronto, Ont., Canada
  • fYear
    2005
  • fDate
    7-11 Nov. 2005
  • Abstract
    The use of design patterns in a software system can provide strong indications about the rationale behind the system´s design. As a result, automating the detection of design pattern instances could be of significant help to the process of reverse engineering large software systems. In this paper, we introduce DPVK (Design Pattern Verification toolKit), the first reverse engineering tool to detect pattern instances in Eiffel systems. DPVK is able to detect several different design patterns by examining both the static structure and the dynamic behaviour of a system written in Eiffel. We present three case studies that were performed to assess DPVK´s effectiveness.
  • Keywords
    object-oriented programming; reverse engineering; Design Pattern Verification toolkit; Eiffel system; reverse engineering tool; software design pattern detection; software system design; Databases; Design engineering; Detectors; Documentation; Face detection; Process design; Reverse engineering; Software design; Software engineering; Software systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reverse Engineering, 12th Working Conference on
  • ISSN
    1095-1350
  • Print_ISBN
    0-7695-2474-5
  • Type

    conf

  • DOI
    10.1109/WCRE.2005.14
  • Filename
    1566156