DocumentCode :
2870043
Title :
Sampling of stochastic electromagnetic fields
Author :
Russer, Johannes ; Asenov, Tatjana ; Russer, Peter
Author_Institution :
Institute for Nanoelectronics, Technische Universität München, Arcisstrasse 21, 80333 Munich, Germany
fYear :
2012
fDate :
17-22 June 2012
Firstpage :
1
Lastpage :
3
Abstract :
Stochastic electromagnetic fields can be described by the auto- and cross correlation spectra of the electric and magnetic field values at pairs of points in space. In this work the characterization of noisy electromagnetic fields by sampling the field values in pairs of sampling points is discussed. Sampling of the electric or magnetic field values in all pairs of a set of sampling points yields the correlation matrix of the field samples. If the near-field in a surface of reference enclosing the stochastic field sources is sampled and characterized by its correlation matrix the field radiated in the space outside the surface of reference can be calculated and described by the field correlation spectra. Depending on the number of statistically independent field sources the eigenvalue decomposition of the correlation matrix yields a compact description of the measured EM noise field.
Keywords :
Correlation; Eigenvalues and eigenfunctions; Electromagnetics; Matrix decomposition; Noise; Noise measurement; Stochastic processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC, Canada
ISSN :
0149-645X
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2012.6259785
Filename :
6259785
Link To Document :
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