Title :
True Random Number Generator with a Metastability-Based Quality Control
Author :
Tokunaga, Carlos ; Blaauw, David ; Mudge, Trevor
Author_Institution :
Michigan Univ., Ann Arbor, MI
Abstract :
A proposed metastability-based true random number generator (TRNG) achieves high entropy and passes NIST randomness test by grading the randomness of each metastable event through the measurement of its resolution time, regardless of the output bit value. This allows the system to determine the original noise level at the time of metastability and to tune itself for maximum randomness. A fully integrated 0.036mm2 TRNG is fabricated and measured in a 0.13mum technology.
Keywords :
quality control; random number generation; 0.13 micron; metastability-based quality control; randomness test; true random number generator; Control systems; Counting circuits; Filtering; Latches; Metastasis; Quality control; Random number generation; Signal resolution; Statistics; Temperature measurement;
Conference_Titel :
Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0853-9
Electronic_ISBN :
0193-6530
DOI :
10.1109/ISSCC.2007.373465