• DocumentCode
    2870108
  • Title

    AN ACCURATE BRIDGING FAULT TEST PATTERN GENERATOR

  • Author

    Millman, Steven D. ; Garvey, James P., Sr.

  • fYear
    1991
  • fDate
    26-30 Oct 1991
  • Firstpage
    411
  • Keywords
    CMOS logic circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Monitoring; Semiconductor device modeling; Strontium; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1991, Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-8186-9156-5
  • Type

    conf

  • DOI
    10.1109/TEST.1991.519701
  • Filename
    519701