Title :
X-series approach to high density 128K and high speed 32K EPROMs
Author :
Guterman, D. ; Klaas, J. ; Armstrong, G. ; Neal, J. ; McElroy, D. ; Reed, Patrick ; Richardson, William ; Stiegler, H. ; Rimawi, I.
Author_Institution :
Texas Instruments, Inc., Houston, TX, USA
Keywords :
Circuits; Decoding; Doping; EPROM; Instruments; Memory architecture; Technological innovation; Timing; Uninterruptible power systems; Voltage control;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1980.1156100
