Author :
Solhusvik, Johannes ; Sumi, Hirofumi
Author_Institution :
Micron Technology, Oslo, Norway
Keywords :
CMOS image sensors; CMOS technology; Circuits; Fluorescence; High speed optical techniques; Image sensors; Infrared image sensors; Optical imaging; Optical sensors; Technological innovation;
Conference_Titel :
Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-4244-0853-9
Electronic_ISBN :
0193-6530
DOI :
10.1109/ISSCC.2007.373512
