Title :
STATISTICAL PRODUCT MONITORING: A POWERFUL TOOL FOR QUALITY IMPROVEMENT
Author :
Cole, Barbara ; Hinkle, Steven ; Herzog, Glen ; Sherry, Peter ; Ngo, Phung
Keywords :
Circuit testing; Computerized monitoring; Condition monitoring; Electric variables measurement; Inspection; Integrated circuit testing; Manufacturing processes; Materials reliability; Scanning probe microscopy; Stress;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519706
