Title :
A Self-Calibrated On-chip Phase-Noise-Measurement Circuit with -75dBc Single-Tone Sensitivity at 100kHz Offset
Author :
Khalil, Waleed ; Bakkaloglu, Bertan ; Kiaei, Sayfe
Author_Institution :
Intel, Chandler, AZ
Abstract :
An on-chip phase-noise-measurement circuit with single-tone measurement sensitivity of -75dBc at 100kHz offset from carrier is presented. The circuit uses a delay-line and mixer frequency discriminator and can operate up to 2GHz input frequency. This module does not rely on a reference clock and, with on-line self calibration, its accuracy is stabilized across gate-delay variations.
Keywords :
discriminators; integrated circuit measurement; integrated circuit noise; mixers (circuits); noise measurement; phase noise; 100 kHz; 2 GHz; delay-line; gate-delay variations; mixer frequency discriminator; on-chip phase-noise-measurement circuit; online self calibration; reference clock; single-tone measurement sensitivity; Circuit noise; Clocks; Delay lines; Frequency; Inverters; Jitter; Noise measurement; Output feedback; Phase measurement; Phase noise;
Conference_Titel :
Solid-State Circuits Conference, 2007. ISSCC 2007. Digest of Technical Papers. IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0853-9
Electronic_ISBN :
0193-6530
DOI :
10.1109/ISSCC.2007.373536
