DocumentCode
2871297
Title
A mold and transfer technique for lead-free fluxless soldering and application to wafer-level low-temperature thin-film packages
Author
Stark, Brian H. ; Najafi, Khalil
Author_Institution
Center for Wireless Integrated Microsyst., Michigan Univ., Ann Arbor, MI, USA
fYear
2004
fDate
2004
Firstpage
13
Lastpage
16
Abstract
This paper demonstrates a technique to pre-mold and transfer lead-free solder balls for MEMS/electronics packaging applications. A reusable bulk micromachined silicon wafer is used to mold a solder paste and remove excess flux prior to transfer to a host wafer that may contain released MEMS. This technique has been used to fabricate low temperature thin film vacuum packages. Long term (>5 months) reliability of these packages at room temperature and pressure is demonstrated through integrated Pirani gauges. Data from preliminary accelerated lifetime testing (thermal cycling and autoclave soaking) is also offered.
Keywords
electronics packaging; micromechanical devices; reliability; soldering; thin films; transfer moulding; 293 to 298 K; MEMS; Si; autoclave soaking; electronics packaging; integrated Pirani gauges; lead free fluxless soldering; lifetime testing; microelectromechanical system; micromachined silicon wafer; mold technique; reliability; room temperature; solder balls; solder paste; thermal cycling; transfer technique; wafer level low temperature thin film vacuum packages; Electronic packaging thermal management; Electronics packaging; Environmentally friendly manufacturing techniques; Lead; Micromechanical devices; Silicon; Soldering; Temperature; Transistors; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2004. 17th IEEE International Conference on. (MEMS)
Print_ISBN
0-7803-8265-X
Type
conf
DOI
10.1109/MEMS.2004.1290510
Filename
1290510
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