• DocumentCode
    2871297
  • Title

    A mold and transfer technique for lead-free fluxless soldering and application to wafer-level low-temperature thin-film packages

  • Author

    Stark, Brian H. ; Najafi, Khalil

  • Author_Institution
    Center for Wireless Integrated Microsyst., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    2004
  • fDate
    2004
  • Firstpage
    13
  • Lastpage
    16
  • Abstract
    This paper demonstrates a technique to pre-mold and transfer lead-free solder balls for MEMS/electronics packaging applications. A reusable bulk micromachined silicon wafer is used to mold a solder paste and remove excess flux prior to transfer to a host wafer that may contain released MEMS. This technique has been used to fabricate low temperature thin film vacuum packages. Long term (>5 months) reliability of these packages at room temperature and pressure is demonstrated through integrated Pirani gauges. Data from preliminary accelerated lifetime testing (thermal cycling and autoclave soaking) is also offered.
  • Keywords
    electronics packaging; micromechanical devices; reliability; soldering; thin films; transfer moulding; 293 to 298 K; MEMS; Si; autoclave soaking; electronics packaging; integrated Pirani gauges; lead free fluxless soldering; lifetime testing; microelectromechanical system; micromachined silicon wafer; mold technique; reliability; room temperature; solder balls; solder paste; thermal cycling; transfer technique; wafer level low temperature thin film vacuum packages; Electronic packaging thermal management; Electronics packaging; Environmentally friendly manufacturing techniques; Lead; Micromechanical devices; Silicon; Soldering; Temperature; Transistors; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2004. 17th IEEE International Conference on. (MEMS)
  • Print_ISBN
    0-7803-8265-X
  • Type

    conf

  • DOI
    10.1109/MEMS.2004.1290510
  • Filename
    1290510