Thermal profiling of photonic integrated circuits by thermoreflectance microscopy

Author

Farzaneh, M. ; Luerssen, D. ; Hudgings, Janice A.

Author_Institution

Dept. of Phys., Mount Holyoke Coll., South Hadley, MA

fYear

2006

fDate

21-26 May 2006

Firstpage

1

Lastpage

2

Abstract

We demonstrate the use of thermoreflectance imaging for wafer-scale testing of photonic integrated circuits. The technique is used to identify damaged devices in a dysfunctional photonic circuit comprised of cascaded semiconductor optical amplifiers.

Keywords

infrared imaging; integrated optics; optical microscopy; optical testing; semiconductor optical amplifiers; thermoreflectance; cascaded semiconductor optical amplifiers; dysfunctional photonic circuit; photonic integrated circuits; thermal profiling; thermoreflectance imaging; thermoreflectance microscopy; wafer-scale testing; Integrated optics; Microscopy; Optical devices; Optical interferometry; Optical pumping; Photonic integrated circuits; Semiconductor optical amplifiers; Stimulated emission; Temperature; Thermoreflectance imaging; (000.2170) Equipment and techniques; (110.6820) Thermal imaging; (120.6780) Temperature; (130.3120) Integrated optics devices;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on

Conference_Location

Long Beach, CA

Print_ISBN

978-1-55752-813-1

Electronic_ISBN

978-1-55752-813-1

Type

conf

DOI

10.1109/CLEO.2006.4628240

Filename

4628240