Title :
Cube-Contained Random Patterns and their Application to the Complete Testing of Synthesized Multi-le
Author :
Pateras, Stephen ; Rajski, Janusz
Keywords :
Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Costs; Coupling circuits; Digital circuits; Filtering; Logic testing; Test pattern generators;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519709
