Title :
INTEGRATING CROSSCHECK TECHNOLOGY INTO THE RAYTHEON TEST ENVIRONMENT
Author :
Lorusso, Stephen M. ; Bompastore, Paul N. ; Fertsch, Michael T.
Keywords :
Application specific integrated circuits; CMOS technology; Circuit faults; Circuit testing; Costs; Integrated circuit technology; Observability; Probes; Software testing; System testing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519714
