DocumentCode
2872329
Title
INTEGRATING CROSSCHECK TECHNOLOGY INTO THE RAYTHEON TEST ENVIRONMENT
Author
Lorusso, Stephen M. ; Bompastore, Paul N. ; Fertsch, Michael T.
fYear
1991
fDate
26-30 Oct 1991
Firstpage
520
Keywords
Application specific integrated circuits; CMOS technology; Circuit faults; Circuit testing; Costs; Integrated circuit technology; Observability; Probes; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519714
Filename
519714
Link To Document