DocumentCode
287300
Title
Reusing basic semiconductor region models in power device bond graph definition
Author
Allard, Bruno ; Morel, Hervé ; Chante, Jean-Pierre
Author_Institution
CNRS, Centre de Genie Electr. de Lyon, France
fYear
1993
fDate
13-16 Sep 1993
Firstpage
34
Abstract
The authors have developed a new device modelling frame based upon bond graphs and state-variable modelling. The bond graph techniques allow one to take full advantage of the classical regional hypothesis that points out particular basic semiconductor regions, i.e, space-charge regions, high-level injection region, etc. The procedure derives separately the different basic semiconductor region models. Then power device modelling consists in assembling these different basic region models to achieve a bond graph. The power device (Pin-diode, MOS and BJT transistors) bond graphs are made of the same basic semiconductor region models. The preliminary circuit simulation results show good accuracy. The modular property of the method allows simple and efficient developments and improvements
Keywords
bipolar transistors; bond graphs; insulated gate field effect transistors; p-i-n diodes; power transistors; semiconductor device models; BJT transistors; MOS transistors; circuit simulation; device modelling frame; high-level injection region; p-i-n diodes; power device bond graph definition; semiconductor region models; space-charge regions; state-variable modelling;
fLanguage
English
Publisher
iet
Conference_Titel
Power Electronics and Applications, 1993., Fifth European Conference on
Conference_Location
Brighton
Type
conf
Filename
265013
Link To Document