• DocumentCode
    287300
  • Title

    Reusing basic semiconductor region models in power device bond graph definition

  • Author

    Allard, Bruno ; Morel, Hervé ; Chante, Jean-Pierre

  • Author_Institution
    CNRS, Centre de Genie Electr. de Lyon, France
  • fYear
    1993
  • fDate
    13-16 Sep 1993
  • Firstpage
    34
  • Abstract
    The authors have developed a new device modelling frame based upon bond graphs and state-variable modelling. The bond graph techniques allow one to take full advantage of the classical regional hypothesis that points out particular basic semiconductor regions, i.e, space-charge regions, high-level injection region, etc. The procedure derives separately the different basic semiconductor region models. Then power device modelling consists in assembling these different basic region models to achieve a bond graph. The power device (Pin-diode, MOS and BJT transistors) bond graphs are made of the same basic semiconductor region models. The preliminary circuit simulation results show good accuracy. The modular property of the method allows simple and efficient developments and improvements
  • Keywords
    bipolar transistors; bond graphs; insulated gate field effect transistors; p-i-n diodes; power transistors; semiconductor device models; BJT transistors; MOS transistors; circuit simulation; device modelling frame; high-level injection region; p-i-n diodes; power device bond graph definition; semiconductor region models; space-charge regions; state-variable modelling;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Power Electronics and Applications, 1993., Fifth European Conference on
  • Conference_Location
    Brighton
  • Type

    conf

  • Filename
    265013