Title :
A thermally actuated three-probe nanomanipulator for efficient handling of individual nanostructures
Author :
Xuefeng Wang ; Vincent, Loren ; Yu, Minfeng ; Huang, Yonggang ; Liu, Chung
Author_Institution :
Illinois Univ., Urbana, IL, USA
Abstract :
We report recent development of a three-probe micromachined nanomanipulator for manipulation and in-situ characterization of nanomaterials in scanning electron microscope (SEM). The nanomanipulator consists of three independent probes having thermal bimetallic actuators and nanoscopic end-effectors. Nanoscale end-effectors with sub-100-nm spacing are created using focused ion beam (FIB) milling to directly interface with nanoscopic objects (e.g., nanotubes, nanowires). Handling of individual carbon nanotubes (CNTs) was successfully realized with the nanomanipulator in an SEM.
Keywords :
carbon nanotubes; end effectors; focused ion beam technology; microactuators; micromachining; micromanipulators; nanotechnology; scanning electron microscopy; C; CNT; FIB milling; SEM; carbon nanotubes; focused ion beam milling; nanomanipulator; nanoscopic end effectors; nanostructure handling; scanning electron microscopy; thermal bimetallic actuators; Actuators; Atomic force microscopy; Electrodes; Nanobioscience; Nanomaterials; Nanostructures; Nanowires; Probes; Scanning electron microscopy; Silicon;
Conference_Titel :
Micro Electro Mechanical Systems, 2004. 17th IEEE International Conference on. (MEMS)
Print_ISBN :
0-7803-8265-X
DOI :
10.1109/MEMS.2004.1290617