DocumentCode :
287318
Title :
Analysis of switching behavior of the power insulated gate bipolar transistor by soft modeling
Author :
Li, J.M. ; Lafore, D. ; Arnould, J. ; Reymond, B.
Author_Institution :
Ecole Superieure d´´Ingenieurs de Marseille, France
fYear :
1993
fDate :
13-16 Sep 1993
Firstpage :
220
Abstract :
A soft modeling method of the power insulated gate bipolar transistor (IGBT) has been developed. The model described (also called `soft model´) is based on simplified one-dimensional semiconductor physics and is suitable for commutation analysis. The soft model is a quantitative method for studying component switching performance and is intended to help the power electronics engineer to make the best use of the device. The inductive load switch-off behavior is presented as an example of the results and the authors show the influence of the drive (Rg,Vg) for a given load condition and that of the load circuit (IL,VL) for a given drive on the switching times and losses
Keywords :
insulated gate bipolar transistors; power transistors; semiconductor device models; semiconductor switches; switching; commutation analysis; inductive load switch-off behavior; insulated gate bipolar transistor; losses; one-dimensional semiconductor physics; power IGBT; power electronics; soft modeling; switching behavior;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Power Electronics and Applications, 1993., Fifth European Conference on
Conference_Location :
Brighton
Type :
conf
Filename :
265034
Link To Document :
بازگشت