• DocumentCode
    287318
  • Title

    Analysis of switching behavior of the power insulated gate bipolar transistor by soft modeling

  • Author

    Li, J.M. ; Lafore, D. ; Arnould, J. ; Reymond, B.

  • Author_Institution
    Ecole Superieure d´´Ingenieurs de Marseille, France
  • fYear
    1993
  • fDate
    13-16 Sep 1993
  • Firstpage
    220
  • Abstract
    A soft modeling method of the power insulated gate bipolar transistor (IGBT) has been developed. The model described (also called `soft model´) is based on simplified one-dimensional semiconductor physics and is suitable for commutation analysis. The soft model is a quantitative method for studying component switching performance and is intended to help the power electronics engineer to make the best use of the device. The inductive load switch-off behavior is presented as an example of the results and the authors show the influence of the drive (Rg,Vg) for a given load condition and that of the load circuit (IL,VL) for a given drive on the switching times and losses
  • Keywords
    insulated gate bipolar transistors; power transistors; semiconductor device models; semiconductor switches; switching; commutation analysis; inductive load switch-off behavior; insulated gate bipolar transistor; losses; one-dimensional semiconductor physics; power IGBT; power electronics; soft modeling; switching behavior;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Power Electronics and Applications, 1993., Fifth European Conference on
  • Conference_Location
    Brighton
  • Type

    conf

  • Filename
    265034