Title :
High voltage subscriber line interface LSIs
Author :
Kawarada, K. ; Hayashi, Teruaki ; Inabe, Y. ; Imagawa, H.
Author_Institution :
NTT Musashino Electrical Communication Laboratory, Tokyo, Japan
Abstract :
A three-chip subscriber line interface used to separate high and low-voltage functions will be discussed, The interface consists of a 320V dielectrically-isolated ringing test access chip, a 60V bipolar SLIC and a CMOS control circuit.
Keywords :
Batteries; Circuit noise; Codecs; Electronics packaging; Mirrors; Pulse circuits; Resistors; Surge protection; Surges; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1982 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1982.1156285
